Product Information

The TS-UVNIR100 is an independently developed, high-performance UV-Visible-Near-Infrared Spectrophotometer.

The instrument incorporates integrated transmission, specular reflection, and integrating sphere accessories. It can measure transmission and reflection spectral data for a variety of samples, including coatings, architectural glass, and semiconductor materials.

Key Features

• Features an imported light source that provides a longer service life and better stability.
• Two imported detectors cover the ultraviolet, visible, and near-infrared wavelength regions, providing greater sensitivity to weak signals, lower noise, and higher accuracy.
• The optical system uses a double-beam, double-grating, and double-detector design. This reduces background interference, improves measurement accuracy, and achieves full spectral coverage across the ultraviolet, visible, and near-infrared wavelength regions.
• A computer provides automatic control of the instrument, including grating switching, filter switching, receiver switching, and wavelength scanning. The instrument calibrates itself automatically at startup and completes data acquisition and processing automatically.

Technical Parameters

Applications

• Coatings: Measurement of transmission and reflection spectral data.
• Architectural Glass: Spectral transmission and reflection measurement.
• Semiconductor Materials: Optical spectral measurement and analysis.
• Material Testing Laboratories: Transmission and specular reflection analysis of different samples.